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X-RAY DIFFRACTOMETER "RIKOR-6"
for the
study of structural and elemental composition of inorganic
materials of all shapes and sizes |
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APPLICATIONS:
- Microelectronics (ferro-piezoelectric ceramics, ferrites, films,
electrolytic coatings, semiconductors).
- Metallurgy (structure of rolled composites)
- Engineering (recrystallization as a result of processing,
hardening coating, welded joints).
- Geology and mining.
- Chemicals.
- Fertilizer production
- Cement Industry.
- Ecology.
- Archeology and restoration.
- Production and study of special materials (cermets, high
temperature materials and high pressure)
- Study of crystallization, phase transformations in research
laboratories and industrial environments.
- Dynamic study of the impact of various factors - such as
temperature, pressure, radiation.
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The X-ray diffractometer "RIKOR-6" is designed for structural and elemental analysis of powder and
liquid samples, as well as large parts. Functionally the x-ray
diffractometer combined with energy dispersive spectrometer
channel that provides information, as on the elemental
composition and the structure of the sample. |
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Features of X-ray
diffractometer "RIKOR-6"
- The
new portable diffractometer combined with
the x-ray fluorescence spectrometer
- Portability
- The lack of movement while shooting
- Simultaneous recording of a broad section of the spectrum
- Expressive evaluation
- Radiation Safety
- Ease of maintenance and operation
- Allows you to analyze powders, liquids, samples of any shape,
large parts
- Minimal or no sample preparation
- High resolution detectors
- The system optical alignment and determining the place of
analysis
- Two-wave (2 X-ray. Tube) diffractometer, with no additional
tuning of the transition from one type of radiation to another.
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The use
of capillary half - lens in X-ray diffractometer "RIKOR-6"
allows you to create a spatially collimated (both horizontally
and
vertically) X-ray radiation with a divergence ~ 3 * 10-3 rad,
increase the area of the flow of quasi
-parallel
x-ray beams from the source to
the sample. Peculiarity of X-ray Kumahov's half-lens is to
capture X-ray emission from the focus of
X-ray tube (linear or
fine-focus) and its transport throw specific capillary channels.
At the downstream of half - lens each separate channel is a
source of X-rays. Thus, the output of half-lens essentially have
a lot of microfocus sources, there is a division of linear or
fine- focus spot in microfocus sources. Focal spot size can vary
depending on the size of capillaries from a few to hundreds of
microns. |
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Thanks polycapillary optics
· Collimation-dimensional
geometry of the parallel beam is ideal for general analysis
· Great capture angle - the intensification
· Adjusting geometric form of the x-ray beam
No · defocusing
· No displacement of the sample: it provides a good and a
definite phase analysis
· Permanent form of the peak improves the accuracy of the
analysis of the structure
UNIT -
LAYOUT
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X-ray tube in this x-ray
diffractometer with air cooling does
not require a complex system of water cooling. The unit of
radiation is safe at a distance of 20 cm
Register spectrum of samples carried out at fixed
positions of the radiation source and a position-sensitive
detector. Simultaneous collection of the spectrum in the angular
range 55 ° can significantly speed up the analysis of the
objects of study and record the rapid processes.
The size of the diffraction spots on the sample
- 2mm to
0,2 mm, place the X-ray beam exposure is fixed with the help of
an optical system for aligning, i.e. the device can be used as
micro-diffractometer
To increase the resolution of the device and reduce the
background in this x-ray diffractometer, designed filter unit ahead of the detector. All
sections of the diffraction space are measured with the same
resolution |
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Application of a
filter unit in this x-ray diffractometer increases the resolution of close peaks,
provides filtering of radiation, increases the ratio of peak /
background of four times, improve accuracy of the angular
position of diffraction peak |
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Typical
diffraction patterns
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SOFTWARE OF
X-RAY DIFFRACTOMETER "RIKOR-6"
Allows you to handle the
resulting spectrum with the definition of the situation, the
intensity and width of the diffraction peaks, separated
superimposed diffraction peaks, subtract background, to smooth
the spectrum, to view a series of captured samples
Phase
analysis of the studied samples is carried out using the search
engine with a large selection of identity-based criteria for the
use of databases of polycrystalline materials.
Energy dispersive
x-ray spectrometer channel allows for qualitative and
quantitative analysis of chemical elements contained in the
sample. You can analyze elements from Al13 up to U92. The range
of concentrations: 50 g / tonne (ppm) to 100%.
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Basic
Specifications of X-ray Diffractometer "RIKOR-6"
- Goniometer Weight - 10 kg
- Control unit - 15 kg
- The total mass of the device - up to 25 kg
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X-ray tube:
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Power - 10 (5) W
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anode - Cu (Mo or Fe - options)
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size of the focus - 0,2 x 2mm
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Cooling - air
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Angular interval of simultaneous recording - 55 ° in 2Θ
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The angular range of 2Θ - 10 -160 °
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Angular resolution - 0,01 ° / channel
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Detector - position-sensitive proportional, gas-filled, sealed
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The radius of the goniometer - 114,8 mm
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Electric power consumption - 220 V, 50-60 Hz, 125 W
- Operating Environment - Temperature + 5 C to + 25 C
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Humidity - 20% to 80% |
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The X-ray Diffractometer
"RIKOR-6" Consists:
- kinematics absent goniometer with the
x-ray source
- polycapillary X-ray
half -lens
- detector with simultaneous registration of an angle not less
than 55 ° in 2Θ
- power supply and control
- laptop
- software
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Environmental safety:
- Availability of the hygienic certificate exempting it from
registration and control of SES (government
department);
(diffractometer exempt from
registration and control of SES in relation
with the coincidence apparatus doses with a dose of natural
background)
- Special requirements for the placement is not required;
- License to work with the device is not required;
- Entered in the register GOSSTANDARD Russia
(government department). |
