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 Microfocus X-ray Fluorescence Spectrometer
- microfocus RFA analyzer
"Focus-2"
Microfocus X-ray Fluorescence Spectrometer
"FOCUS-2" On The Base Of Kumakhov Polycapillary Optics
Microfocus X-ray Fluorescence Spectrometer
Analyzer "Focus-2" on the
basis of Kumakhov polycapillary optics is designed for express RFA analysis of the composition and
concentration of chemical elements in solids, loose materials, powders,
liquids, samples precipitated on films and filter paper.
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Microfocus X-ray
Fluorescence Analyzer Spectrometer
"Focus-2" comprises:
- 3D sample alignment stage
- measurement camera
- optical microscope with video
camera capacity to enable observation of the sample image on the
computer monitor
- x-ray tube complete with power
supply
- x-ray-optical lens with focal
spot size within the range of 50 to 250 micron
- lens alignment assembly
- semiconductor detector
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Principle
operation of microfocus x-ray spectrometer "Focus-2" : by moving the stage, the target area on the
sample placed in the measurement chamber for element composition
study is identified. The location of X-ray probe matches the
crosshair of the optical microscope enabling control of the target
point. Two laser beams are also aimed at the same point to provide
for height adjustment of the sample. When those beams match the
microscope’s cross, the target point is aligned for x-ray exposure.
The microfocus x-ray spectrometer "Focus-2" is easy to operate, features full computer
control, no special qualified servicing personnel is required to run
it.
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Microfocus
X-ray Fluorescence Spectrometer "Focus-2"on the basis of Kumakhov
polycapillary optics has a wide range of application, such as:
Ferrous and non-ferrous metallurgy,geology, mining, ecology,
jewelry, forensic sciences, customs inspection, chemical industry,
pharmacology and pharmaceutics, human-related investigations, and
many more...
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The
Microfocus X-ray Fluorescence Spectrometer "Focus-2" is certified ( Pattern Approval Certificate of Measuring
Instruments RU.C.31.002.A N 6322 ), and has been highly appraised at
a major international trade show “Kuzbass Fair”.
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Spectrum of Telluride in gold
Tungsten ore
Pentlandite spectrum
Banknote, different points
Spectrum of human hair
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SPECIFICATIONS
OF X-RAY SPECTROMETER "FOCUS-2"
Chamber for samples
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Sample
size
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from 20
micron to 50õ50 õ30 mm
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Sample
type
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solids,
powders, liquids, films
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Measurement
environment
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air
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Movement
control
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manual
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Movement
step along Õ and Y
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18 mm
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Movement
step along Z
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8 mm
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Identification
of the position of x-ray on the sample
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optical
and with lasers
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Detector
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Detector
type
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Si-PIN
diode
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Cooling
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Peltier
element
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Energy
resolution for 5.9 KeV line
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186-200
eV
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Load on
the detector without resolution losses
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5000
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X-ray Source & Power supply
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X-ray
source
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OXFORD
x-ray tube
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Anode
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Ìo
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Optional
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Rh
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Filter
application capability
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YES
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High
voltage
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50 kV
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Current
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1.0 mA
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Cooling
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air
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X-ray
tube control modes
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computer-assisted
and manual
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Microscope
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Optical
magnification range
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15-60
times
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Digital
camera capability
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YES
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General
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Elemental
Analysis
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Qualitative
and Quantitative
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Range of
Identified Elements
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from P
to U
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Range of
measurement
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from 30
ppm to 100%
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Maximum
sensitivity
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10 ppm
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Number
of concurrently identified elements
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up to 20
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Time of
analysis
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60 to
600 sec
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Sample
illumination
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20 W
halogen lamp
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Design
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Analyzer
Unit
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450x230x450
mm
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Power
Supply Unit
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340x320x130
mm
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Make
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desktop
instrument
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Computer
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IBM-compatible
Pentium III and better
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Operating
Conditions
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temperature
5 to 30° Ñrelative
humidity 20 to 80 %
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