Portable X-ray diffractometer "RIKOR-7"

Portable X-ray diffractometer "RIKOR-7" (on the basis of capillary optics)

X-RAY DIFFRACTOMETER "RIKOR-7" to study the structural composition of inorganic materials

APPLICATIONS OF THE X-RAY DIFFRACTOMETER "RIKOR-7":

- Microelectronics (ferro - piezoelectric ceramics, ferrites, films, electrolytic coatings, semiconductors).
- Metallurgy (metals and their alloys, the structure of rolled metal, composites, etc.).
- Mechanical engineering (phase composition and structure of individual elements of different structures, welded joints).
- Geology and mining.
- Chemistry.
- Ecology
- Study of crystallization, phase transformations in research laboratories and industrial environments.
- Dynamic study of the impact of various factors - such as temperature, pressure, radiation and other areas.

X-ray diffractometer "RIKOR-7" is a handheld, portable device is intended to express the structural analysis of inorganic materials of any form, including powders, sorbents and solid samples, as well as large parts, and contains polycapillary X-ray optics (half-lens ) to create a parallel collimated beam.
Structural analysis of the studied samples in this x-ray diffractometer is carried out using the search engine with a large selection of identity-based criteria for the use of databases of polycrystalline materials. Database ICDD selected specialized and contains the required number of compositions.

Thanks polycapillary optics

· Collimation-dimensional geometry of the parallel beam is ideal for general analysis
· Great capture angle - the intensification
· Adjusting geometric form of the x-ray beam
No · defocusing
· No displacement of the sample: it provides a good and a definite phase analysis
· Permanent form of the peak improves the accuracy of the analysis of the structure

X-ray tube with air cooling does not require a complex system of water cooling. The unit of radiation is safe at a distance of 20 cm
     Register spectrum of samples in this x-ray diffractometer is carried out at fixed positions of the radiation source and a position-sensitive detector. Simultaneous collection of the spectrum in the angular range 55 ° can significantly speed up the analysis of the objects of study and record the rapid processes.
     The size of the diffraction spots on the sample- 2mm to 0,2 mm, place the X-ray beam exposure is fixed with the help of an optical system for aligning, i.e. the device can be used as micro - x-ray diffractometer
     To increase the resolution of the x-ray diffractometer "RIKOR-7" and reduce the background is designed filter unit ahead of the detector. All sections of the diffraction space are measured with the same resolution

Application of a filter unit increases the resolution of close peaks, provides filtering of radiation, increases the ratio of peak / background of four times, improve accuracy of the angular position of diffraction peak, measured by this x-ray diffractometer "RIKOR-7".

Typical diffraction patterns

THE X-RAY DIFFRACTOMETER SOFTWARE

Allows you to handle the resulting spectrum with the definition of the situation, the intensity and width of the diffraction peaks, separate superimposed diffraction peaks, subtract background, to smooth the spectrum, to view a series of captured by x-ray diffractometer samples

The phase analysis of the studied samples in x-ray diffractometer "RIKOR-7" is carried out using the search engine with a large selection of identity-based criteria for the use of databases of polycrystalline materials.

Basic Specifications of the X-ray Diffractometer "RIKOR-7"

- Goniometer Weight - 10 kg
           Control unit - 15 kg
           The total mass of the device - up to 25 kg
- X-ray tube:
           Power - 10 (5) W
           anode - Cu (Mo or Fe - options)
           size of the focus - 0,2 x 2mm
           Cooling - air
- Angular interval of simultaneous recording - 55 ° in 2Θ
- The angular range of 2Θ - 10 -160 °
- Angular resolution - 0,01 ° / channel
- Detector - position-sensitive proportional, gas-filled, sealed
- The radius of the goniometer - 114,8 mm
- Electric power consumption - 220 V, 50-60 Hz, 125 W
- Operating Environment - Temperature + 5 C to + 25 C
- Humidity - 20% to 80%

The composition of the instrument:

kinematics absent goniometer with the x-ray source
polycapillary X-ray half - lens
detector with simultaneous registration of an angle not less than 55 ° in 2Θ
power supply and control
laptop
software

Environmental safety:

- Availability of the hygienic certificate exempting it from registration and government control (SES) ;
(diffractometer exempt from registration and control of government (SES) in relation
with the coincidence apparatus doses with a dose of natural background)
- Special requirements for the placement is not required;
- License to work with the device is not required;
- Entered in the register GOSSTANDARD Russia (government department).